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CRYSTAL DEFECT IMAGING USING TRANSMISSION ION CHANNELING
Journal article   Peer reviewed

CRYSTAL DEFECT IMAGING USING TRANSMISSION ION CHANNELING

P KING, M BREESE, P WILSHAW, G BOOKER and G GRIME
ANNALES DE CHIMIE-SCIENCE DES MATERIAUX, Vol.19(5-6), pp.257-267
01/01/1994

Abstract

Science & Technology Physical Sciences Technology Chemistry Multidisciplinary Materials Science Multidisciplinary Chemistry Materials Science CHEMISTRY MULTIDISCIPLINARY MATERIALS SCIENCE MULTIDISCIPLINARY MICROSCOPY SILICON LAYERS
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