Abstract
We propose a novel approach to generate a binary descriptor optimized for each image patch independently. The approach is inspired by the linear discriminant embedding that simultaneously increases inter and decreases intra class distances. A set of discriminative and uncorrelated binary tests is established from all possible tests in an offline training process. The patch adapted descriptors are then efficiently built online from a subset of features which lead to lower intra-class distances and thus, to a more robust descriptor. We perform experiments on three widely used benchmarks and demonstrate improvements in matching performance, and illustrate that per-patch optimization outperforms global optimization.