An EXAFS and XRD study of the structure of nanocrystalline Ti-B-N thin films

TP Mollart; PN Gibson; MA Baker

doi:10.1088/0022-3727/30/13/001

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Journal article

An EXAFS and XRD study of the structure of nanocrystalline Ti-B-N thin films

TP Mollart, PN Gibson and MA Baker

JOURNAL OF PHYSICS D-APPLIED PHYSICS, Vol.30(13), pp.1827-1832

07/07/1997

DOI: https://doi.org/10.1088/0022-3727/30/13/001

Abstract

Science & Technology

Physical Sciences

Physics

Applied

Physics

PHYSICS

APPLIED

HARD COATINGS

TITANIUM

BEHAVIOR

SPECTRA

SIZE

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Title: An EXAFS and XRD study of the structure of nanocrystalline Ti-B-N thin films
Creators: TP Mollart
PN Gibson
MA Baker
Publication Details: JOURNAL OF PHYSICS D-APPLIED PHYSICS, Vol.30(13), pp.1827-1832
Publisher: IOP PUBLISHING LTD
Date published: 07/07/1997
Date submitted: 17/05/2017
Identifiers: 99513526002346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

An EXAFS and XRD study of the structure of nanocrystalline Ti-B-N thin films

Abstract

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