Alleviation of temperature effects in the Raman micro-spectroscopy of boron doped silicon microstructures

MA Lourenco; DJ Gardiner; V Gouvernayre; M Bowden; J Hedley; D Wood

doi:10.1023/A:1006764605146

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Alleviation of temperature effects in the Raman micro-spectroscopy of boron doped silicon microstructures

Journal article

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Alleviation of temperature effects in the Raman micro-spectroscopy of boron doped silicon microstructures

MA Lourenco, DJ Gardiner, V Gouvernayre, M Bowden, J Hedley and D Wood

JOURNAL OF MATERIALS SCIENCE LETTERS, Vol.19(9), pp.771-773

01/05/2000

DOI: https://doi.org/10.1023/A:1006764605146

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Materials Science

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Title: Alleviation of temperature effects in the Raman micro-spectroscopy of boron doped silicon microstructures
Creators: MA Lourenco
DJ Gardiner
V Gouvernayre
M Bowden
J Hedley
D Wood
Publication Details: JOURNAL OF MATERIALS SCIENCE LETTERS, Vol.19(9), pp.771-773
Publisher: KLUWER ACADEMIC PUBL
Date published: 01/05/2000
Date submitted: 17/05/2017
Identifiers: 99513480702346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

Alleviation of temperature effects in the Raman micro-spectroscopy of boron doped silicon microstructures

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