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Accurate depth profiling of complex optical coatings
Journal article   Peer reviewed

Accurate depth profiling of complex optical coatings

C Jeynes, NP Barradas, H Rafla-Yuan, BP Hichwa and R Close
SURFACE AND INTERFACE ANALYSIS, Vol.30(1), pp.237-242
01/08/2000

Abstract

Science & Technology Physical Sciences Chemistry Physical Chemistry CHEMISTRY PHYSICAL RES simulated annealing optical coatings thin-film structure RUTHERFORD BACKSCATTERING DATA IBA METHODS RESOLUTION RBS SIMULATION
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