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A novel wafer-scale CMOS APS X-ray detector for breast cancer diagnosis using X-ray diffraction studies
Journal article   Peer reviewed

A novel wafer-scale CMOS APS X-ray detector for breast cancer diagnosis using X-ray diffraction studies

A Konstantinidis, Y Zheng, R Speller, D Philip and S Vinnicombe
Journal of Instrumentation, Vol.7(12)
12/2012

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