A new method for charge-loss correction of room-temperature semiconductor detectors using digital trapezoidal pulse shaping

M Nakhostin; P Veeramani

doi:10.1088/1748-0221/7/06/P06006

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A new method for charge-loss correction of room-temperature semiconductor detectors using digital trapezoidal pulse shaping

Journal article

Peer reviewed

A new method for charge-loss correction of room-temperature semiconductor detectors using digital trapezoidal pulse shaping

M Nakhostin and P Veeramani

JOURNAL OF INSTRUMENTATION, Vol.7, ARTN P0600

01/06/2012

DOI: https://doi.org/10.1088/1748-0221/7/06/P06006

Abstract

Science & Technology

Technology

Instruments & Instrumentation

INSTRUMENTS & INSTRUMENTATION

Digital signal processing (DSP)

Online farms and online filtering

Gamma detectors (scintillators

CZT

HPG

HgI etc)

GAMMA-RAY SPECTROSCOPY

RADIATION DETECTORS

HIGH-RESOLUTION

SIGNALS

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Title: A new method for charge-loss correction of room-temperature semiconductor detectors using digital trapezoidal pulse shaping
Creators: M Nakhostin
P Veeramani
Publication Details: JOURNAL OF INSTRUMENTATION, Vol.7, ARTN P0600
Publisher: IOP PUBLISHING LTD
Date published: 01/06/2012
Date submitted: 17/05/2017
Identifiers: 99515536702346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

A new method for charge-loss correction of room-temperature semiconductor detectors using digital trapezoidal pulse shaping

Abstract

Files and links (1)

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