2-STAGE RELIABILITY TESTS WITH TECHNOLOGICAL EVOLUTION - A BAYESIAN-ANALYSIS

GA WHITMORE; KDS YOUNG; AC KIMBER

doi:10.2307/2986021

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2-STAGE RELIABILITY TESTS WITH TECHNOLOGICAL EVOLUTION - A BAYESIAN-ANALYSIS

Journal article

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2-STAGE RELIABILITY TESTS WITH TECHNOLOGICAL EVOLUTION - A BAYESIAN-ANALYSIS

GA WHITMORE, KDS YOUNG and AC KIMBER

APPLIED STATISTICS-JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES C, Vol.43(2), pp.295-307

01/01/1994

DOI: https://doi.org/10.2307/2986021

Abstract

Science & Technology

Physical Sciences

Statistics & Probability

Mathematics

STATISTICS & PROBABILITY

BAYESIAN ANALYSIS

DEMONSTRATION TESTS

ENGINEERING DESIGN

FAILURE

GAMMA-DISTRIBUTION

INFERENCE

POISSON DISTRIBUTION

RELIABILITY

SIEGEL DISTRIBUTION

TECHNOLOGY

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Title: 2-STAGE RELIABILITY TESTS WITH TECHNOLOGICAL EVOLUTION - A BAYESIAN-ANALYSIS
Creators: GA WHITMORE
KDS YOUNG
AC KIMBER
Publication Details: APPLIED STATISTICS-JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES C, Vol.43(2), pp.295-307
Publisher: BLACKWELL PUBL LTD
Date published: 01/01/1994
Date submitted: 17/05/2017
Identifiers: 99512549802346
Academic Unit: University of Surrey
Language: English
Resource Type: Journal article

2-STAGE RELIABILITY TESTS WITH TECHNOLOGICAL EVOLUTION - A BAYESIAN-ANALYSIS

Abstract

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