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An XPS and ToF-SIMS investigation of the outermost nanometres of a poly(vinylidene difluoride) coating
Journal article   Open access  Peer reviewed

An XPS and ToF-SIMS investigation of the outermost nanometres of a poly(vinylidene difluoride) coating

SJ Hinder, C Lowe and JF Watts
PROGRESS IN ORGANIC COATINGS, Vol.60(3), pp.255-261
01/10/2007
DOI: https://doi.org/10.1016/j.porgcoat.2007.07.016

Abstract

Science & Technology Physical Sciences Technology Chemistry Applied Materials Science Coatings & Films Chemistry Materials Science CHEMISTRY APPLIED MATERIALS SCIENCE COATINGS & FILMS time-of-flight secondary ion mass spectrometry X-ray photoelectron spectroscopy PVdF coating depth profiling C-60 polymer ION MASS-SPECTROMETRY RAY PHOTOELECTRON-SPECTROSCOPY HIGH-RESOLUTION XPS BUCKMINSTERFULLERENE PROBE SEGREGATION PHENOMENA COPOLYMER BLENDS SURFACE FILMS FLUORIDE) POLYMER
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