W-band noise figure measurement designed for on-wafer characterisation

R Drury; RD Pollard; CM Snowden

Back

Conference presentation

W-band noise figure measurement designed for on-wafer characterisation

R Drury, RD Pollard and CM Snowden

1996 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, pp.1273-1276

1996 IEEE MTT-S International Microwave Symposium (SAN FRANCISCO, CA, 17/06/1996 - 21/06/1996)

01/01/1996

Abstract

Science & Technology

Technology

Engineering

Electrical & Electronic

Engineering

Files and links (1)

url

http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1996BF95U00297&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=11d2a86992e85fb529977dad66a846d5View

Author

Metrics

19 Record Views

Details

Title: W-band noise figure measurement designed for on-wafer characterisation
Creators: R Drury
RD Pollard
CM Snowden
Contributors: RG Ranson
RD Pollard
I E E E (Publisher)
Publication Details: 1996 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3, pp.1273-1276
Conference: 1996 IEEE MTT-S International Microwave Symposium (SAN FRANCISCO, CA, 17/06/1996 - 21/06/1996)
Date published: 01/01/1996
Date submitted: 16/05/2017
Identifiers: 99513387302346
Academic Unit: University of Surrey
Resource Type: Conference presentation

W-band noise figure measurement designed for on-wafer characterisation

Abstract

Files and links (1)

Metrics

Details

Usage Policy