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The determination of on-wafer noise parameters at W-band
Conference presentation

The determination of on-wafer noise parameters at W-band

TA Alam, RD Pollard and CM Snowden
27TH EUROPEAN MICROWAVE 97, CONFERENCE + EXHIBITION - BRIDGING THE GAP BETWEEN INDUSTRY AND ACADEMIA, VOLS I AND II, pp.687-691
27th European Microwave Conference and Exhibition- Bridging the Gap Between Industry and Academia (EuMC 97) (JERUSALEM, ISRAEL, 08/09/1997 - 12/09/1997)
01/01/1997

Abstract

Science & Technology Technology Engineering Electrical & Electronic Engineering
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