The application of secondary ion mass spectrometry (SIMS) to the study of high temperature proton conductors (HTPC)

RA DeSouza; JA Kilner; C Jeynes

doi:10.1016/S0167-2738(97)00038-6

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The application of secondary ion mass spectrometry (SIMS) to the study of high temperature proton conductors (HTPC)

Conference presentation

Peer reviewed

The application of secondary ion mass spectrometry (SIMS) to the study of high temperature proton conductors (HTPC)

RA DeSouza, JA Kilner and C Jeynes

SOLID STATE IONICS, Vol.97(1-4), pp.409-419

VIII International Conference on Solid State Protonic Conductors (GOL, NORWAY, 18/08/1996 - 23/08/1996)

01/05/1997

DOI: https://doi.org/10.1016/S0167-2738(97)00038-6

Abstract

Science & Technology

Physical Sciences

Chemistry

Physical

Physics

Condensed Matter

Chemistry

Physics

CHEMISTRY

PHYSICAL

PHYSICS

CONDENSED MATTER

Perovskite oxides

SIMS

IEDP

oxygen diffusion

fluorine

BARIUM CERATE

CONDUCTIVITY

OXIDES

BACEO3

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Title: The application of secondary ion mass spectrometry (SIMS) to the study of high temperature proton conductors (HTPC)
Creators: RA DeSouza
JA Kilner
C Jeynes
Contributors: ELSEVIER SCIENCE BV (Publisher)
Publication Details: SOLID STATE IONICS, Vol.97(1-4), pp.409-419
Conference: VIII International Conference on Solid State Protonic Conductors (GOL, NORWAY, 18/08/1996 - 23/08/1996)
Date published: 01/05/1997
Date submitted: 17/05/2017
Identifiers: 99513961302346
Academic Unit: University of Surrey
Resource Type: Conference presentation

The application of secondary ion mass spectrometry (SIMS) to the study of high temperature proton conductors (HTPC)

Abstract

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