TEM studies of dislocation-based silicon light emitting devices

M Milosavljevic; MA Lourenco; MSA Siddiqui; G Shao; RM Gwilliam; KP Homewood

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TEM studies of dislocation-based silicon light emitting devices

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TEM studies of dislocation-based silicon light emitting devices

M Milosavljevic, MA Lourenco, MSA Siddiqui, G Shao, RM Gwilliam and KP Homewood

ELECTRON MICROSCOPY AND ANALYSIS 2003, (179), pp.99-102

Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003) (Univ Oxford, Examinat Sch, Oxford, ENGLAND, 03/09/2003 - 05/09/2003)

01/01/2004

Abstract

Science & Technology

Technology

Physical Sciences

Materials Science

Characterization & Testing

Microscopy

Physics

Multidisciplinary

Materials Science

Physics

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Title: TEM studies of dislocation-based silicon light emitting devices
Creators: M Milosavljevic
MA Lourenco
MSA Siddiqui
G Shao
RM Gwilliam
KP Homewood
Contributors: S McVitie
D McComb
IOP PUBLISHING LTD (Publisher)
Publication Details: ELECTRON MICROSCOPY AND ANALYSIS 2003, (179), pp.99-102
Conference: Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG 2003) (Univ Oxford, Examinat Sch, Oxford, ENGLAND, 03/09/2003 - 05/09/2003)
Date published: 01/01/2004
Date submitted: 17/05/2017
Identifiers: 99516822902346
Academic Unit: University of Surrey
Resource Type: Conference presentation

TEM studies of dislocation-based silicon light emitting devices

Abstract

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