Surface integral determination of built-in electric fields and analysis of exciton binding energies in nitride-based quantum dots

DP Williams; AD Andreev; DA Faux; EP O'Reilly

doi:10.1016/j.physe.2003.11.039

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Surface integral determination of built-in electric fields and analysis of exciton binding energies in nitride-based quantum dots

Conference presentation

Peer reviewed

Surface integral determination of built-in electric fields and analysis of exciton binding energies in nitride-based quantum dots

DP Williams, AD Andreev, DA Faux and EP O'Reilly

PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, Vol.21(2-4), pp.358-362

11th International Conference on Modulated Semiconductor Structures (MSS11) (Nara, JAPAN, 14/07/2003 - 18/07/2003)

01/03/2004

DOI: https://doi.org/10.1016/j.physe.2003.11.039

Abstract

Science & Technology

Physical Sciences

Nanoscience & Nanotechnology

Physics

Condensed Matter

Science & Technology - Other Topics

Physics

NANOSCIENCE & NANOTECHNOLOGY

PHYSICS

CONDENSED MATTER

quantum dots

piezoelectric potential

GaN

excitons

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Title: Surface integral determination of built-in electric fields and analysis of exciton binding energies in nitride-based quantum dots
Creators: DP Williams
AD Andreev
DA Faux
EP O'Reilly
Contributors: ELSEVIER SCIENCE BV (Publisher)
Publication Details: PHYSICA E-LOW-DIMENSIONAL SYSTEMS & NANOSTRUCTURES, Vol.21(2-4), pp.358-362
Conference: 11th International Conference on Modulated Semiconductor Structures (MSS11) (Nara, JAPAN, 14/07/2003 - 18/07/2003)
Date published: 01/03/2004
Date submitted: 17/05/2017
Identifiers: 99514359402346
Academic Unit: University of Surrey
Resource Type: Conference presentation

Surface integral determination of built-in electric fields and analysis of exciton binding energies in nitride-based quantum dots

Abstract

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