Structural and optical characterisation of undoped Si-Si0.78Ge0.22/Si(001) superlattices grown by MBE

OA Mironov; PJ Phillips; EHC Parker; MG Dowsett; NP Barradas; C Jeynes; M Mironov; VP Gnezdilov; V Ushakov; VV Eremenko

doi:10.1016/S0040-6090(97)00240-X

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Structural and optical characterisation of undoped Si-Si0.78Ge0.22/Si(001) superlattices grown by MBE

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Structural and optical characterisation of undoped Si-Si0.78Ge0.22/Si(001) superlattices grown by MBE

OA Mironov, PJ Phillips, EHC Parker, MG Dowsett, NP Barradas, C Jeynes, M Mironov, VP Gnezdilov, V Ushakov and VV Eremenko

THIN SOLID FILMS, Vol.306(2), pp.307-312

Workshop on Molecular Beam Expitaxy-Growth Physics and Technology (MBE-GPT 96) (WARSAW, POLAND, 21/10/1996 - 25/10/1996)

11/09/1997

DOI: https://doi.org/10.1016/S0040-6090(97)00240-X

Abstract

Science & Technology

Technology

Physical Sciences

Materials Science

Multidisciplinary

Materials Science

Coatings & Films

Physics

Applied

Physics

Condensed Matter

Materials Science

Physics

MATERIALS SCIENCE

COATINGS & FILMS

MATERIALS SCIENCE

MULTIDISCIPLINARY

PHYSICS

APPLIED

PHYSICS

CONDENSED MATTER

Si-Si1-xGex superlattices

characterisation by SIMS

RBS and ellipsometry

Raman scattering in strained-layer heterostructures

STRAINED-LAYER SUPERLATTICES

FOLDED ACOUSTIC PHONONS

DEPTH RESOLUTION

RAMAN-SCATTERING

IBA METHODS

SILICON

WELLS

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Title: Structural and optical characterisation of undoped Si-Si0.78Ge0.22/Si(001) superlattices grown by MBE
Creators: OA Mironov
PJ Phillips
EHC Parker
MG Dowsett
NP Barradas
C Jeynes
M Mironov
VP Gnezdilov
V Ushakov
VV Eremenko
Contributors: ELSEVIER SCIENCE SA (Publisher)
Publication Details: THIN SOLID FILMS, Vol.306(2), pp.307-312
Conference: Workshop on Molecular Beam Expitaxy-Growth Physics and Technology (MBE-GPT 96) (WARSAW, POLAND, 21/10/1996 - 25/10/1996)
Date published: 11/09/1997
Date submitted: 17/05/2017
Identifiers: 99511388702346
Academic Unit: University of Surrey
Resource Type: Conference presentation

Structural and optical characterisation of undoped Si-Si0.78Ge0.22/Si(001) superlattices grown by MBE

Abstract

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