Sensitivity and resolution in optical coherence micro-elastography

L. Chin; A. Curatolo; P. Wijesinghe; K.M. Kennedy; R.A. McLaughlin; B.F. Kennedy; David Sampson

doi:10.1109/IPCon.2015.7323503

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Sensitivity and resolution in optical coherence micro-elastography

L. Chin, A. Curatolo, P. Wijesinghe, K.M. Kennedy, R.A. McLaughlin, B.F. Kennedy and David Sampson

pp.1-2

Institute of Electrical and Electronics Engineers Inc.

2015

DOI: https://doi.org/10.1109/IPCon.2015.7323503

Abstract

Medical imaging

Axial resolutions

Elastography

Spatial filterings

Photonics

This study describes a framework for characterizing resolution and sensitivity in optical coherence micro-elastography, and presents a means of optimizing these parameters through spatial filtering. Results show improved axial resolution with no loss in sensitivity.

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Title: Sensitivity and resolution in optical coherence micro-elastography
Creators: L. Chin
A. Curatolo
P. Wijesinghe
K.M. Kennedy
R.A. McLaughlin
B.F. Kennedy
David Sampson
Publication Details: pp.1-2
Publisher: Institute of Electrical and Electronics Engineers Inc.
Number of pages: 2
Date published: 2015
Date submitted: 01/06/2018
Identifiers: 99512347602346
Academic Unit: FEPS Central Faculty Admin; FHMS Central Faculty Admin
Resource Type: Conference presentation

Sensitivity and resolution in optical coherence micro-elastography

Abstract

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