Reflectivity fitting for accurate thickness and compositional determination in RCLEDs

TE Sale; K Hild; TJC Hosea; M Hirotani; Y Kato

doi:10.1117/12.529654

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Reflectivity fitting for accurate thickness and compositional determination in RCLEDs

TE Sale, K Hild, TJC Hosea, M Hirotani and Y Kato

LIGHT -EMITTING DIODES: RESEARCH, MANUFACTURING, AND APPLICATIONS VIII, Vol.5366, pp.191-199

8th Conference on Light-Emitting Diodes (San Jose, CA, 27/01/2004 - 28/01/2004)

01/01/2004

DOI: https://doi.org/10.1117/12.529654

Abstract

Science & Technology

Technology

Physical Sciences

Materials Science

Multidisciplinary

Optics

Physics

Condensed Matter

Materials Science

Physics

RCLED

VCSEL

reflectivity

least squares fitting

CAVITY

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Title: Reflectivity fitting for accurate thickness and compositional determination in RCLEDs
Creators: TE Sale
K Hild
TJC Hosea
M Hirotani
Y Kato
Contributors: SA Stockman
HW Yao
EF Schubert
SPIE-INT SOC OPTICAL ENGINEERING (Publisher)
Publication Details: LIGHT -EMITTING DIODES: RESEARCH, MANUFACTURING, AND APPLICATIONS VIII, Vol.5366, pp.191-199
Conference: 8th Conference on Light-Emitting Diodes (San Jose, CA, 27/01/2004 - 28/01/2004)
Date published: 01/01/2004
Date submitted: 17/05/2017
Identifiers: 99516520002346
Academic Unit: University of Surrey
Resource Type: Conference presentation

Reflectivity fitting for accurate thickness and compositional determination in RCLEDs

Abstract

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