Near-edge X-ray absorption fine structure study of carbon nitride films

C Lenardi; MA Baker; V Briois; GC Lecis; P Piseri; W Gissler

doi:10.1016/S0257-8972(99)00585-X

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Near-edge X-ray absorption fine structure study of carbon nitride films

Conference presentation

Peer reviewed

Near-edge X-ray absorption fine structure study of carbon nitride films

C Lenardi, MA Baker, V Briois, GC Lecis, P Piseri and W Gissler

SURFACE & COATINGS TECHNOLOGY, Vol.125(1-3), pp.317-321

1999 E-MRS Conference, Symposium B: Protective Coatings and Thin Films (STRASBOURG, FRANCE, 01/06/1999 - 04/06/1999)

01/03/2000

DOI: https://doi.org/10.1016/S0257-8972(99)00585-X

Abstract

Science & Technology

Technology

Physical Sciences

Materials Science

Coatings & Films

Physics

Applied

Materials Science

Physics

MATERIALS SCIENCE

COATINGS & FILMS

PHYSICS

APPLIED

carbon nitride

dual ion beam deposition

near-edge X-ray absorption fine structure

LOW-TEMPERATURE

DIAMOND

ENERGY

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Title: Near-edge X-ray absorption fine structure study of carbon nitride films
Creators: C Lenardi
MA Baker
V Briois
GC Lecis
P Piseri
W Gissler
Contributors: ELSEVIER SCIENCE SA (Publisher)
Publication Details: SURFACE & COATINGS TECHNOLOGY, Vol.125(1-3), pp.317-321
Conference: 1999 E-MRS Conference, Symposium B: Protective Coatings and Thin Films (STRASBOURG, FRANCE, 01/06/1999 - 04/06/1999)
Date published: 01/03/2000
Date submitted: 17/05/2017
Identifiers: 99513910602346
Academic Unit: University of Surrey
Resource Type: Conference presentation

Near-edge X-ray absorption fine structure study of carbon nitride films

Abstract

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