Nanometer scale masked ion damage barriers in YBa2Cu3O7-delta

DJ Kang; R Speaks; NH Peng; R Webb; C Jeynes; WE Booij; EJ Tarte; DF Moore; MG Blamire

doi:10.1109/77.919461

Back

Nanometer scale masked ion damage barriers in YBa2Cu3O7-delta

Conference presentation

Open access

Peer reviewed

Nanometer scale masked ion damage barriers in YBa2Cu3O7-delta

DJ Kang, R Speaks, NH Peng, R Webb, C Jeynes, WE Booij, EJ Tarte, DF Moore and MG Blamire

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, Vol.11(1), pp.780-783

2000 Applied Superconductivity Conference (VIRGINIA BEACH, VIRGINIA, 17/09/2000 - 22/09/2000)

01/03/2001

DOI: https://doi.org/10.1109/77.919461

Abstract

Science & Technology

Technology

Physical Sciences

Engineering

Electrical & Electronic

Physics

Applied

Engineering

Physics

ENGINEERING

ELECTRICAL & ELECTRONIC

PHYSICS

APPLIED

superconducting devices

nanotechnology YBCO

SNS devices

SUPERCONDUCTOR JOSEPHSON-JUNCTIONS

ELECTRON

BEAM

IMPLANTATION

Files and links (3)

pdf

nanometer scale158.47 kBDownload View

Text Open Access

url

http://dx.doi.org/10.1109/77.919461View

Published (Version of record)

url

http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000168285400180&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=11d2a86992e85fb529977dad66a846d5View

Author

Metrics

208 File views/ downloads

39 Record Views

Details

Title: Nanometer scale masked ion damage barriers in YBa2Cu3O7-delta
Creators: DJ Kang
R Speaks
NH Peng
R Webb
C Jeynes
WE Booij
EJ Tarte
DF Moore
MG Blamire
Contributors: IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC (null)
Publication Details: IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, Vol.11(1), pp.780-783
Conference: 2000 Applied Superconductivity Conference (VIRGINIA BEACH, VIRGINIA, 17/09/2000 - 22/09/2000)
Date published: 01/03/2001
Date submitted: 19/10/2012
Identifiers: 99511933602346
Academic Unit: School of Computer Science and Electronic Engineering
Resource Type: Conference presentation

Nanometer scale masked ion damage barriers in YBa2Cu3O7-delta

Abstract

Files and links (3)

Metrics

Details

Usage Policy