- Title
- Ion implanted silicides studies by frequency noise level measurements
- Creators
- M StojanovicA VasicC Jeynes
- Contributors
- ELSEVIER SCIENCE BV (Publisher)
- Publication Details
- NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.112(1-4), pp.192-195
- Conference
- Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation/Symposium C on Pushing the Limits of Ion Beam Processing - From Engineering to Atomic Scale Issues, at the E-MRS 95 Spring Meeting (STRASBOURG, FRANCE, 22/05/1995 - 26/05/1995)
- Date published
- 01/05/1996
- Date submitted
- 17/05/2017
- Identifiers
- 99516122302346
- Academic Unit
- University of Surrey
- Resource Type
- Conference presentation
Conference presentation
Ion implanted silicides studies by frequency noise level measurements
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, Vol.112(1-4), pp.192-195
Symposium J on Correlated Effects in Atomic and Cluster Ion Bombardment and Implantation/Symposium C on Pushing the Limits of Ion Beam Processing - From Engineering to Atomic Scale Issues, at the E-MRS 95 Spring Meeting (STRASBOURG, FRANCE, 22/05/1995 - 26/05/1995)
01/05/1996
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