Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra-low-angle microtomy

SJ Hinder; JF Watts; C Lowe

doi:10.1002/sia.1830

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Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra-low-angle microtomy

Conference presentation

Peer reviewed

Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra-low-angle microtomy

SJ Hinder, JF Watts and C Lowe

SURFACE AND INTERFACE ANALYSIS, Vol.36(8), pp.1032-1036

10th European Conference on Applications of Surface and Interface Analysis (ECASIA 03) (Berlin, GERMANY, 05/10/2003 - 10/10/2003)

01/08/2004

DOI: https://doi.org/10.1002/sia.1830

Abstract

Science & Technology

Physical Sciences

Chemistry

Physical

Chemistry

CHEMISTRY

PHYSICAL

ultra-low-angle microtomy

x-ray photoelectron spectroscopy

polymeric coatings

depth profiling

multilayer interfaces

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Title: Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra-low-angle microtomy
Creators: SJ Hinder
JF Watts
C Lowe
Contributors: JOHN WILEY & SONS LTD (Publisher)
Publication Details: SURFACE AND INTERFACE ANALYSIS, Vol.36(8), pp.1032-1036
Conference: 10th European Conference on Applications of Surface and Interface Analysis (ECASIA 03) (Berlin, GERMANY, 05/10/2003 - 10/10/2003)
Date published: 01/08/2004
Date submitted: 17/05/2017
Identifiers: 99512453002346
Academic Unit: University of Surrey
Resource Type: Conference presentation

Interface analysis and compositional depth profiling by XPS of polymer coatings prepared using ultra-low-angle microtomy

Abstract

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