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Influence of Structural Defects on the Electronic Properties of Carbon Nanotubes Examined by Scanning Tunnelling Microscopy
Conference presentation

Influence of Structural Defects on the Electronic Properties of Carbon Nanotubes Examined by Scanning Tunnelling Microscopy

CE Giusca and SRP Silva
Semiconductor Nanowires - Growth, Physics, Devices, and Applications, Vol.Volume
Mater. Res. Soc. Symp. Spring Meeting (San Francisco, CA, 05/04/2010 - 08/04/2010)
17/05/2017

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