Improving fault prediction using Bayesian networks for the development of embedded software applications

E Perez-Minana; J-J Gras

doi:10.1002/stvr.353

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Improving fault prediction using Bayesian networks for the development of embedded software applications

Conference presentation

Peer reviewed

Improving fault prediction using Bayesian networks for the development of embedded software applications

E Perez-Minana and J-J Gras

SOFTWARE TESTING VERIFICATION & RELIABILITY, Vol.16(3), pp.157-174

3rd United Kingdom Workshop on Software Testing Research (Univ Sheffield, Sheffield, ENGLAND, 05/09/2005 - 06/09/2005)

01/09/2006

DOI: https://doi.org/10.1002/stvr.353

Abstract

Science & Technology

Technology

Computer Science

Software Engineering

Computer Science

COMPUTER SCIENCE

SOFTWARE ENGINEERING

Bayesian networks

software quality

fault prediction

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Title: Improving fault prediction using Bayesian networks for the development of embedded software applications
Creators: E Perez-Minana
J-J Gras
Contributors: JOHN WILEY & SONS LTD (Publisher)
Publication Details: SOFTWARE TESTING VERIFICATION & RELIABILITY, Vol.16(3), pp.157-174
Conference: 3rd United Kingdom Workshop on Software Testing Research (Univ Sheffield, Sheffield, ENGLAND, 05/09/2005 - 06/09/2005)
Date published: 01/09/2006
Date submitted: 17/05/2017
Identifiers: 99511773202346
Academic Unit: University of Surrey
Resource Type: Conference presentation

Improving fault prediction using Bayesian networks for the development of embedded software applications

Abstract

Files and links (1)

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