High-resolution alpha spectrometry with a thin-window silicon carbide semiconductor detector

FH Ruddy; JG Seidel; P Sellin

doi:10.1109/NSSMIC.2009.5402072

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Conference presentation

High-resolution alpha spectrometry with a thin-window silicon carbide semiconductor detector

FH Ruddy, JG Seidel and P Sellin

IEEE Nuclear Science Symposium Conference Record (NSS/MIC), pp.2201-2206

Nuclear Science Symposium (Orlando, USA, 24/10/2009 - 01/11/2009)

2009

DOI: https://doi.org/10.1109/NSSMIC.2009.5402072

Abstract

The potential for high-resolution alpha-particle energy spectrometry in high-temperature, high-radiation environments using thin-window 4H-SiC radiation detectors has been demonstrated. 238Pu alpha-particle peaks separated by only 42.7 keV have been completely resolved using a SiC Schottky detector with a 400 AÃÂ¿ titanium Schottky contact (entrance window). The observed FWHM for the 238Pu 5499.2-keV alpha particle peak is 20.6 keV or 0.37%. Factors affecting the observed alpha-particle energy resolution in SiC detectors will be discussed.

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Title: High-resolution alpha spectrometry with a thin-window silicon carbide semiconductor detector
Creators: FH Ruddy
JG Seidel
P Sellin
Contributors: IEEE (Publisher)
Publication Details: IEEE Nuclear Science Symposium Conference Record (NSS/MIC), pp.2201-2206
Conference: Nuclear Science Symposium (Orlando, USA, 24/10/2009 - 01/11/2009)
Date published: 2009
Date submitted: 17/05/2017
Identifiers: 99511569602346
Academic Unit: University of Surrey
Resource Type: Conference presentation

High-resolution alpha spectrometry with a thin-window silicon carbide semiconductor detector

Abstract

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