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Electron field emission from amorphous carbon films as a function of deposition self bias, nitrogen content and substrate resistivity - experiment and simulation
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Electron field emission from amorphous carbon films as a function of deposition self bias, nitrogen content and substrate resistivity - experiment and simulation

RD Forrest, GY Chen and SRP Silva
MATERIALS CHEMISTRY AND PHYSICS, Vol.72(2), pp.204-209
Taiwan Diamond 2000 Meeting (INST ATOMIC MOLECULAR SCI ACAD SINICA, TAIPEI, TAIWAN, 30/07/2000 - 02/08/2000)
01/11/2001

Abstract

Science & Technology Technology Materials Science Multidisciplinary Materials Science MATERIALS SCIENCE MULTIDISCIPLINARY CVD field emission amorphous materials
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