Electron energy loss line spectral and TEM analysis of heterojunctions

V Stolojan; MJ Whiting; MJ Goringe; MJ Kelly; SRP Silva

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Electron energy loss line spectral and TEM analysis of heterojunctions

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Electron energy loss line spectral and TEM analysis of heterojunctions

V Stolojan, MJ Whiting, MJ Goringe, MJ Kelly and SRP Silva

MICROSCOPY OF SEMICONDUCTING MATERIALS 2003, (180), pp.41-44

Conference on Microscopy of Semiconducting Materials (Univ Cambridge, Cambridge, ENGLAND, 31/03/2003)

01/01/2003

Abstract

Science & Technology

Technology

Physical Sciences

Materials Science

Characterization & Testing

Microscopy

Physics

Multidisciplinary

Physics

Condensed Matter

Materials Science

Physics

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Title: Electron energy loss line spectral and TEM analysis of heterojunctions
Creators: V Stolojan
MJ Whiting
MJ Goringe
MJ Kelly
SRP Silva
Contributors: AG Cullis
PA Midgley
IOP PUBLISHING LTD (Publisher)
Publication Details: MICROSCOPY OF SEMICONDUCTING MATERIALS 2003, (180), pp.41-44
Conference: Conference on Microscopy of Semiconducting Materials (Univ Cambridge, Cambridge, ENGLAND, 31/03/2003)
Date published: 01/01/2003
Date submitted: 17/05/2017
Identifiers: 99515506102346
Academic Unit: University of Surrey
Resource Type: Conference presentation

Electron energy loss line spectral and TEM analysis of heterojunctions

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