Characterization of thick epitaxial GaAs layers for X-ray detection

H Samic; GC Sun; V Donchev; NX Nghia; M Gandouzi; M Zazoui; JC Bourgoin; H El-Abbassi; S Rath; PJ Sellin

doi:10.1016/S0168-9002(02)00953-1

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Characterization of thick epitaxial GaAs layers for X-ray detection

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Characterization of thick epitaxial GaAs layers for X-ray detection

H Samic, GC Sun, V Donchev, NX Nghia, M Gandouzi, M Zazoui, JC Bourgoin, H El-Abbassi, S Rath and PJ Sellin

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, Vol.487(1-2), pp.107-112

3rd International Workshop on Radiation Imaging Detectors (OROSEI, ITALY, 23/09/2001 - 27/09/2001)

11/07/2002

DOI: https://doi.org/10.1016/S0168-9002(02)00953-1

Abstract

Science & Technology

Technology

Physical Sciences

Instruments & Instrumentation

Nuclear Science & Technology

Physics

Particles & Fields

Spectroscopy

Physics

INSTRUMENTS & INSTRUMENTATION

NUCLEAR SCIENCE & TECHNOLOGY

PHYSICS

PARTICLES & FIELDS

SPECTROSCOPY

GaAs

epitxial layer

pin structure

X-ray detector

MECHANISM

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Title: Characterization of thick epitaxial GaAs layers for X-ray detection
Creators: H Samic
GC Sun
V Donchev
NX Nghia
M Gandouzi
M Zazoui
JC Bourgoin
H El-Abbassi
S Rath
PJ Sellin
Contributors: ELSEVIER SCIENCE BV (Publisher)
Publication Details: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, Vol.487(1-2), pp.107-112
Conference: 3rd International Workshop on Radiation Imaging Detectors (OROSEI, ITALY, 23/09/2001 - 27/09/2001)
Date published: 11/07/2002
Date submitted: 17/05/2017
Identifiers: 99513933502346
Academic Unit: University of Surrey
Resource Type: Conference presentation

Characterization of thick epitaxial GaAs layers for X-ray detection

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