Abstract
In this paper we propose a novel approach to generate a binary descriptor optimized for each image patch independently. The approach is inspired by the linear discriminant embedding that simultaneously increases inter and decreases intra class distances. A set of discriminative and uncorrelated binary tests is established from all possible tests in an offline training process. The patch adapted descriptors are then efficiently built online from a subset of tests which lead to lower intra class distances thus a more robust descriptor. A patch descriptor consists of two binary strings where one represents the results of the tests and the other indicates the subset of the patch-related robust tests that are used for calculating a masked Hamming distance. Our experiments on three different benchmarks demonstrate improvements in matching performance, and illustrate that per-patch optimization outperforms global optimization