- Title
- Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures
- Creators
- TJC HoseaSA CrippsTE SaleK Hild
- Contributors
- ELSEVIER SCIENCE BV (Publisher)
- Publication Details
- APPLIED SURFACE SCIENCE, Vol.253(1), pp.70-79
- Conference
- Symposium P of the Spring Meeting of the European-Materials-Research-Society entitled Curent Trends in Optical and X-ray Meterology of Advanced Materials for Nanoscale Devices (Strasbourg, FRANCE, 31/05/2005 - 03/06/2005)
- Date published
- 31/10/2006
- Date submitted
- 17/05/2017
- Identifiers
- 99512850302346
- Academic Unit
- University of Surrey
- Resource Type
- Conference presentation
Conference presentation
Analysis of reflectance and modulation spectroscopic lineshapes in optoelectronic device structures
APPLIED SURFACE SCIENCE, Vol.253(1), pp.70-79
Symposium P of the Spring Meeting of the European-Materials-Research-Society entitled Curent Trends in Optical and X-ray Meterology of Advanced Materials for Nanoscale Devices (Strasbourg, FRANCE, 31/05/2005 - 03/06/2005)
31/10/2006
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