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Recombination and loss mechanisms in low-threshold InAs-GaAs 1.3-mu m quantum-dot lasers
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Recombination and loss mechanisms in low-threshold InAs-GaAs 1.3-mu m quantum-dot lasers

Igor Marko, Alfred Adams, Stephen Sweeney, DJ Mowbray, MS Skolnick, HYY Liu and KM Groom
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, Vol.11(5), pp.1041-1047
IEEE
19th IEEE International Semiconductor Laser Conference (Matsue, JAPAN, 21/09/2004–25/09/2004)
01/09/2005

Abstract

Science & Technology Technology Physical Sciences Engineering Electrical & Electronic Optics Physics Applied research Engineering Physics characteristic temperature hydrostatic high pressure IrAs quantum dot (QD) recombination mechanisms semiconductor laser threshold current 1.3 MU-M TEMPERATURE-DEPENDENCE CURRENT-DENSITY AUGER RECOMBINATION OPTICAL-PROPERTIES ROOM-TEMPERATURE ACTIVE-REGION HIGH-POWER PERFORMANCE GAIN

We show that even in quantum-dot (QD) lasers with very low threshold current densities (J(th) = 40-50 A/cm(2) at 300 K), the temperature sensitivity of the threshold current arises from nonradiative recombination that comprises similar to 60% to 70% of J(th) at 300 K, whereas the radiative part of J(th) is almost temperature insensitive. The influence of the nonradiative recombination mechanism decreases with increasing hydrostatic pressure and increasing band gap, which leads to a decrease of the threshold current. We also studied, for the first time, the band gap dependence of the radiative part Of Jth, which in contrast increases strongly with increasing band gap. These results suggest that Auger recombination is an important intrinsic recombination mechanism for 1.3-mu m lasers, even in a very low threshold QD device, and that it is responsible for the temperature sensitivity of the threshold current.

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